Advantest - Model EVA100 - Evolutionary Value Added Measurement System
From IC Test Systems- Evolutionary Value Added Measurement System
In recent years the number of smart devices we use has increased significantly. The role of the analog / sensor IC has become critically important not only in the smart society but also in other fields. More than ever, higher performance, tighter accuracy and longer reliability are required for those devices. To address these challenges measurement systems need to have many features while maintaining a very low test cost and engineers tasked with developing test programs require very good coding skills plus in-depth operation knowledge of the test system.
Product Details
The new highly integrated measurement system 'EVA100' is supporting Power Supplies, SMU( 4 quadrant DC Signal Measurement Units ), Pattern Generators, Arbitrary Waveform Generators, Digitizers and Oscilloscopes necessary for complete analog / mixed-signal device evaluation and measurement.This new measurement system allows engineers quickly to build their own measurement environment without combining several standalone instruments.
A newly developed Software GUI is extremely intuitive, requiring only drag & drop operation, enabling engineers to create device focused measurement set ups in a very fast and simple manner. Automatic report functions dramatically improves the efficiency of deskwork, providing clear documentation and data ready for publishing in device data sheets.
Features
This new measurement system EVA100 that 'Can do what you want, quickly' for the characterization, functional evaluation and mass production evaluations of low pin count analog(*1), mixed signal(*2) and Digital IC(*3) devices.
(∗1): DC-DC Converter or Voltage regulator ICs
(∗2): AD Converter DA Converter ICs
(∗3): MCU or Standard Logic ICs, DFT Test
Small
All necessary functions are integrated into the compact body which has VI sources, Digital and Signal Capture.
Testing Units
- Digital Unit: 220mm (W) × 472mm (D) × 206mm (H)
- Analog Unit: 363mm (W) × 472mm (D) × 206mm (H)
High Performance
The Event Master Sequencer (EMS) controls the hardware with high timing accuracy and high precision enabling superior repeatability. Analog VI source, General Control Module and Signal Capture instruments provide versatile and comprehensive measurement capability.
Intuitive
No programming language environment offers very intuitive operation for users, so that everyone from the beginner to expert is able to use the system quickly. Automatic report generation tools reduce the need for additional deskwork, improving the efficiency of evaluation and measurement tasks dramatically.
Expandable
Stackable Testing Unit architecture supports many scenarios from design to production for analog and Mixed Signal devices.
Supporting external instruments, customized measurement systems can also be created according to more specific requirements and needs.
Support characterization, functional evaluation and mass production evaluations efficiently.
Functions
The EMS controlls the system bus and distributes the reference clocks.
- Optical Connection to Controller (PC, EWS)
- System Bus control and synchronization
- Synchronization between EVA systems
- Control of External Instruments (e.g. Measurement equipment or Thermal Streamer)
By adding a temperature sensor on a performance board (PB), evaluation activities under temperature test can be automated.
The AVI is a Source and Measurement Unit for supplying voltage and current to the device under test (DUT). Each channel can supply up to 500mA current and up to +/-64V. Arbitrary Waveform Generator and Digitizer capabilities per pin enable the simple creation of complex measurements.
MVI has the same functionalities as AVI, supplying voltage and current to the device under test (DUT). Each channel can supply up to 2A DC current and a voltage range of +/-128V, suitable for higher power output DC-DC converter ICs.
SCAP (Signal CAPture module)
4 channels high frequency sampling digitizer to observe and measure the transient response waveform or behavior from device under test (DUT).
GCM (General Control Module)
Supports digital control with protocol based commands and the control of relays and external circuitry on the performance board (PB).
The SYNC controls the system bus and distributes the reference clocks, specially excellent Digital synchronization.
- Optical Connection to Controller (PC, EWS)
- System Bus control and synchronization
- Synchronization between EVA systems
- Utility Power Supply and Control of relays
- Control of External Instruments (e.g. Measurement equipment or Thermal Streamer)
By adding a temperature sensor on a performance board (PB), evaluation activities under temperature test can be automated.
Highly integrated measurement module such as Device Power Supply, Analog capability and Digital Pattern Generation. Matrix function allows simplified device interface design by routing the analog signal Input and Output path from Digital channel. Time Measurement Unit, VBump Function, Reference Voltage.
Synchronized Sequence Control (Sequence Editor)
Sequence Editor makes it easy to synchronize multiple hardware channels based on how the user determines when events occur. The Sequence Editor also supports continuous measurement or conditional loop settings enabling greater control of automated measurements.
Protocol Support (RegisterMap)
I2C, SPI, JTAG I/F are supported by protocol based control. By preparing the RegisterMap, We can use the register name for digital patterns instead of neumonics so that RegisterMap gives you the very clear overview for the digital pattern and improve readability and efficiency of digital pattern debug.
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