Solar Metrology Equipment Supplied In USA

Automatic wafer geometry gauge.Wafer diameter 2', 3' and 4'.Thickness range 200 - 800µm.Accuracy 1µm.Resolution 0.1µm.Software ...

Multi-Junction solar cell metrology is more complicated than that of a single junction one. As these cells are made of multiple layers, a multi-source/LED solar simulator is usually employed to allow adjustment of band to band irradiance ratios. Our triple junction reference cells can be used to set the correct irradiance for each single ...